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Structural and morphological dataset for rfsputtered WC-Co thin films using synchrotron radiation methods

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dc.contributor.author Phiri, Resego
dc.contributor.author Oladijo, Oluseyi Philip
dc.contributor.author Nakajima, Hideki
dc.contributor.author Rattanachata, Arunothai
dc.contributor.author Akinlabi, Esther Titilayo
dc.date.accessioned 2021-09-28T14:14:06Z
dc.date.available 2021-09-28T14:14:06Z
dc.date.issued 2019-08
dc.identifier.citation Phiri, R. et al. (2019) Structural and morphological dataset for rfsputtered WC-Co thin films using synchrotron radiation methods. Data in Brief, 25, 104383. https://doi.org/10.1016/j.dib.2019.104383. en_US
dc.identifier.issn 2352-3409
dc.identifier.uri http://repository.biust.ac.bw/handle/123456789/363
dc.description.abstract Control and manipulation of synthesis parameters of thin film coatings is of critical concern in determination of material properties and performance. Structural and morphological properties of rf-sputtered WC-Co thin films deposited under varying deposition parameters namely, substrate temperature and rf power are presented in this data article. The surface morphology, crystallite size and nature were acquired using x-ray photoelectron spectroscopy (XPS) and Grazing Incidence X-ray absorption spectroscopy (GI-XAS). Furthermore, Synchrotron findings are correlated with complimentary data acquired from Scanning electron microscopy (SEM), Raman spectroscopy and surface profilometry to predict and point out optimum synthesis parameters for best properties of the film. en_US
dc.description.sponsorship The financial support from the Botswana International University of Science and Technology (BIUST), Palapye. en_US
dc.language.iso en en_US
dc.publisher Elsevier B.V. en_US
dc.subject WC-Co thin films en_US
dc.subject X-ray photoelectron spectroscopy (XPS) en_US
dc.subject Grazing incidence X-ray absorption spectroscopy (GI-XAS) en_US
dc.subject Synchrotron radiation en_US
dc.subject Scanning electron microscopy (SEM) en_US
dc.title Structural and morphological dataset for rfsputtered WC-Co thin films using synchrotron radiation methods en_US
dc.description.level phd en_US
dc.description.accessibility unrestricted en_US
dc.description.department cme en_US


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